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What Cognitive Interviews Tell Us about Bias in Cross-cultural Research: An Illustration Using Quality-of-life Items

Autores: Benitez, I; Padilla, JL; van de Vijver, F; Cuevas, A

An Embedded Printed Antenna with Omnidirectional Azimuth Coverage for Automotive Applications

Autores: Gonzalez, JMF; Padilla, P; Valenzuela-Valdes, JF; Padilla, JL; Sierra-Castaner, M

InGaAs Capacitor-Less DRAM Cells TCAD Demonstration

Autores: Navarro, C; Navarro, S; Marquez, C; Donetti, L; Sampedro, C; Karg, S; Riel, H; Gamiz, F

A Novel Reconfigurable Sub-0.25-V Digital Logic Family Using the Electron-Hole Bilayer TFET

Autores: Alper, C; Padilla, JL; Palestri, P; Ionescu, AM

Source-to-Drain Tunneling Analysis in FDSOI, DGSOI, and FinFET Devices by Means of Multi subband Ensemble Monte Carlo

Autores: Medina-Bailon, C; Padilla, JL; Sampedro, C; Godoy, A; Donetti, L; Gamiz, F

Gate Leakage Tunneling Impact on the InAs/GaSb Heterojunction Electron-Hole Bilayer Tunneling Field-Effect Transistor

Autores: Padilla, JL; Medina-Bailon, CM; Marquez, C; Sampedro, C; Donetti, L; Gamiz, F; Ionescu, AM

Analysis of the Heterogate Electron-Hole Bilayer Tunneling Field-Effect Transistor With Partially Doped Channels: Effects on Tunneling Distance Modulation and Occupancy Probabilities

Autores: Padilla, JL; Medina-Bailon, C; Navarro, C; Alper, C; Gamiz, F; Ionescu, AM

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