Systematic method for electrical characterization of random telegraph noise in MOSFETs
FI: 1,58
Type: Article
Collaboration
Year: 2017
Writers
Marquez, C; Rodriguez, N; Gamiz, F; Ohata, A.
Magazine
Title: SOLID-STATE ELECTRONICS
Quartile
- Q3
FI: 1,58
Type: Article
Collaboration
Year: 2017
Marquez, C; Rodriguez, N; Gamiz, F; Ohata, A.
Title: SOLID-STATE ELECTRONICS