Source-to-Drain Tunneling Analysis in FDSOI, DGSOI, and FinFET Devices by Means of Multi subband Ensemble Monte Carlo
FI: 2,62
Type: Article
Artículo original
Year: 2018
Writers
Medina-Bailon, C; Padilla, JL; Sampedro, C; Godoy, A; Donetti, L; Gamiz, F.
Magazine
Title: IEEE TRANSACTIONS ON ELECTRON DEVICES
Quartile
- Q2