Radiation sensitive MOSFETs irradiated with various positive gate biases
FI: 1,77
Type: Article
Collaboration
Year: 2021
Writers
Ristic, GS; Ilic, SD; Duane, R.; Andjelkovic, MS; Palma, A. J.; Lallena, AM; Krstic, MD; Stankovic, SJ; Jaksic, A.B.
Magazine
Title: JOURNAL OF RADIATION RESEARCH AND APPLIED SCIENCES
Quartile
- Q3