Performance and reliability in back-gated CVD-grown MoS2 devices
FI: 1,901
Type: Article
Artículo original
Year: 2021
Writers
Marquez, C; Salazar, N.; Gity, F; Galdon, JC; Navarro, C; Duffy, R.; Hurley, P; Gamiz, F.
Magazine
Title: SOLID-STATE ELECTRONICS
Quartile
- Q3