On the Low-Frequency Noise Characterization of Z (2) -FET Devices
FI: 4,098
Type: Article
Artículo original
Year: 2019
Writers
Marquez, C; Navarro, C; Navarro, S; Padilla, JL; Donetti, L; Sampedro, C; Galy, P; Kim, YT; Gamiz, F.
Magazine
Title: IEEE ACCESS
Quartile
- Q1