On the influence of the back-gate bias on InGaAs Trigate MOSFETs
Type: Proceedings Paper
Artículo original
Year: 2016
Writers
Marin, E.G.; Ruiz, FG; Godoy, A; Gonzalez-Medina, JM; Shop-Moon, IM; Toral, A; Gamiz, F.
Magazine
Title: 2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)