Multisubband Ensemble Monte Carlo Analysis of Tunneling Leakage Mechanisms in Ultrascaled FDSOI, DGSOI, and FinFET Devices
FI: 2,704
Type: Article
Artículo original
Year: 2019
Writers
Medina-Bailon, C; Padilla, JL; Sadi, T; Sampedro, C; Godoy, A; Donetti, L; Georgiev, VP; Gamiz, F; Asenov, A.
Magazine
Title: IEEE TRANSACTIONS ON ELECTRON DEVICES
Quartile
- Q2