Improvement of AlGaN/GaN High-Electron-Mobility Transistor Radio Frequency Performance Using Ohmic Etching Patterns for Ka-Band Applications
FI: 3
Type: Article
Collaboration
Year: 2024
Brands
Lee, M.W.; Chuang, C.W.; Gamiz, F; Chang, E.Y.; Lin, Y.C.
Magazine
Title: MICROMACHINES
Quartile
- Q2