Impact of the Back-Gate Biasing on Trigate MOSFET Electron Mobility
FI: 2,472
Type: Article
Artículo original
Year: 2015
Writers
Marin, E.G.; Ruiz, FG; Godoy, A; Shop-Moon, IM; Martinez-Blanque, C; Gamiz, F.
Magazine
Title: IEEE TRANSACTIONS ON ELECTRON DEVICES
Quartile
- Q1