Experimental Characterization of the Random Telegraph Noise Signature in MOSFETs Under the Influence of Magnetic Fields
FI: 3,433
Type: Article
Artículo original
Year: 2018
Writers
Orchard, OR; Marquez, C; Tec-Chim, AI; Guarin, F; Gutierrez, EA; Gamiz, F.
Magazine
Title: IEEE ELECTRON DEVICE LETTERS
Quartile
- Q1