Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended range temperature and back-bias operation
FI: 1,345
Type: Article
Collaboration
Year: 2016
Writers
Marquez, C; Rodriguez, N; Gamiz, F; Ruiz, R; Ohata, A.
Magazine
Title: SOLID-STATE ELECTRONICS
Quartile
- Q2