Electrical Characterization of Random Telegraph Noise in Back-Biased Ultrathin Silicon-On-Insulator MOSFETs
Type: Proceedings Paper
Collaboration
Year: 2016
Writers
Marquez, C; Rodriguez, N; Gamiz, F; Ohata, A.
Magazine
Title: 2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)