Assessment of Confinement-Induced Band-to-Band Tunneling Leakage in the FinEHBTFET
Type: Proceedings Paper
Artículo original
Year: 2016
Writers
Padilla, JL; Alper, C; Gamiz, F; Ionescu, A.M.
Magazine
Title: 2016 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS 2016)